ZHENG, Wen; LEONG, Wai Yie. Conducted Electromagnetic Susceptibility Analysis of Chips Based on BCI Method. INTI Journal, [S. l.], v. 2025, n. 2, 2025. Disponível em: https://iuojs.intimal.edu.my/index.php/intijournal/article/view/712. Acesso em: 23 aug. 2025.