S.D., Venkatesh; K., Chitra; V.M., Harilakshami. GIS-Enhanced Crop Yield Modeling with Machine Learning. Journal of Innovation and Technology, [S. l.], v. 2024, 2024. Disponível em: https://iuojs.intimal.edu.my/index.php/joit/article/view/623. Acesso em: 7 jun. 2025.